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Characterization of long-periodic layered structures by X-ray diffraction V: small angle X-ray scattering of distorted multilayers

✍ Scribed by Yuji Sasanuma; Kazuo Nakayama

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 962 KB
Volume: 247
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90471-5

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