Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera

✍ Scribed by Yuji Sasanuma; Yukishige Kitano; Akira Ishitani

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 362 KB
• Volume: 190
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(89)90921-8