MOCVD growth and characterization by Raman scattering, x-ray diffraction and Auger spectroscopy of short period GaAs/AlAs and GaAs/Ga1−xAlxAs superlattices

✍ Scribed by R. Azoulay; B. Jusserand; G. Le Roux; P. Ossart; L. Dugrand

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 515 KB
• Volume: 77
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(86)90350-7