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Determination of the effect of a strain relaxation layer on the internal electric field measurement in an InGaN/GaN multiple-quantum-well structure by using electroreflectance spectroscopy
✍ Scribed by Su-Ik Park, Dong-Hyun Jang, Jong-In Shim…
- Book ID
- 120798469
- Publisher
- The Korean Physical Society
- Year
- 2013
- Tongue
- English
- Weight
- 178 KB
- Volume
- 62
- Category
- Article
- ISSN
- 0374-4884
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