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Investigating the effect of off-state stress on trap densities in AlGaN/GaN high electron mobility transistors

✍ Scribed by Liu, L. ;Ren, F. ;Pearton, S. J. ;Fitch, R. C. ;Walker, D. E. ;Chabak, K. D. ;Gillespie, J. K. ;Kossler, M. ;Trejo, M. ;Via, David ;Crespo, A.

Book ID: 127219149
Publisher: AVS (American Vacuum Society)
Year: 2011
Tongue: English
Weight: 722 KB
Volume: 29
Category: Article
ISSN: 1520-8567
DOI: 10.1116/1.3660396

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