investigated by transmission electron microscopy

✍ Scribed by Yu, X. Z.; Mathieu, R.; Arima, T.; Kaneko, Y.; He, J. P.; Uchida, M.; Asaka, T.; Nagai, T.; Kimoto, K.; Asamitsu, A.; Matsui, Y.; Tokura, Y.

• Book ID: 125477832
• Publisher: The American Physical Society
• Year: 2007
• Tongue: English
• Weight: 514 KB
• Volume: 75
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/physrevb.75.174441