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Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy

✍ Scribed by Feng Zhang; Xianghuai Liu; S Jin; H Bender; N.Z Lou; Z.H Wilson

Book ID: 114170227
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 516 KB
Volume: 142
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(98)00211-0

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