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Catastrophic degradation lines at the facet of InGaAsP/InP lasers investigated by transmission electron microscopy

✍ Scribed by Snyder, C. W.; Lee, J. W.; Hull, R.; Logan, R. A.


Book ID
127117708
Publisher
American Institute of Physics
Year
1995
Tongue
English
Weight
419 KB
Volume
67
Category
Article
ISSN
0003-6951

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