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Interfacial reactions between RF sputtered CeO2 film and Si(1 0 0) substrate

✍ Scribed by Ha-Yong Lee; Young-Cheol Lee; Young-Pyo Hong; Kyung-Hyun Ko


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
285 KB
Volume
228
Category
Article
ISSN
0169-4332

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Aluminum nitride (AlN) thin films have been deposited on Si(1 1 1) substrates by using reactive-rf-magnetron-sputtering at 250 Β°C. The crystalline quality and orientation of the films have been studied by X-ray diffraction (XRD). We have observed that the films grow with c-or a-axis orientation. The