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Structural properties of Y2O3 thin films grown on Si(1 0 0) and Si(1 1 1) substrates

✍ Scribed by M. Španková; I. Vávra; Š. Chromik; S. Harasek; R. Lupták; J. Šoltýs; K. Hušeková

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
250 KB
Volume
116
Category
Article
ISSN
0921-5107

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