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Incidence of oxide and interface degradation on MOSFET performance

✍ Scribed by A Cester; L Bandiera; S Cimino; A Paccagnella; G Ghidini

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 206 KB
Volume: 72
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2003.12.018

No coin nor oath required. For personal study only.

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