✦ LIBER ✦
Relationship between profile of stressgenerated interface traps and degradation of submicron LDD mosfet's
✍ Scribed by S. Okhonin; T. Hessler; M. Dutoit
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 283 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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