Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

✍ Scribed by K. Hayama; K. Takakura; H. Ohyama; S. Kuboyama; S. Matsuda; J.M. Rafí; A. Mercha; E. Simoen; C. Claeys

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 400 KB
• Volume: 45
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2005.07.024