✦ LIBER ✦
Impact of nitridation/reoxidation on performance degradation in n-MOSFETs under Fowler-Nordheim injection
✍ Scribed by Z.J. Ma; Z.H. Liu; P.T. Lai; S. Fleischer; Y.C. Cheng
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 531 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0038-1101
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