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In situ reflectance monitoring of InP/InGaAsP films grown by metalorganic vapor phase epitaxy

✍ Scribed by Lum, R. M.; McDonald, M. L.; Bean, J. C.; Vandenberg, J.; Pernell, T. L.; Chu, S. N. G.; Robertson, A.; Karp, A.


Book ID
121730009
Publisher
American Institute of Physics
Year
1996
Tongue
English
Weight
334 KB
Volume
69
Category
Article
ISSN
0003-6951

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