In-situ analysis on the initial growth of ultra-thin ruthenium films with atomic layer deposition
โ Scribed by Geidel, Marion; Junige, Marcel; Albert, Matthias; Bartha, Johann W.
- Book ID
- 120312442
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 948 KB
- Volume
- 107
- Category
- Article
- ISSN
- 0167-9317
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