𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Improved Stress Reliability of Analog Metal–Insulator–Metal Capacitors Using $\hbox{TiO}_{2}/\hbox{ZrO}_{2}$ Dielectrics

✍ Scribed by Lin, S.H.; Chiang, K.C.; Yeh, F.S.; Chin, A.


Book ID
125514128
Publisher
IEEE
Year
2009
Tongue
English
Weight
309 KB
Volume
30
Category
Article
ISSN
0741-3106

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES