Use of a High-Work-Function Ni Electrode to Improve the Stress Reliability of Analog $\hbox{SrTiO}_{3}$ Metal–Insulator–Metal Capacitors

✍ Scribed by Chiang, K.C.; Cheng, C.H.; Jhou, K.Y.; Pan, H.C.; Hsiao, C.N.; Chou, C.P.; McAlister, S.P.; Chin, A.; Hwang, H.L.

• Book ID: 121851772
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 245 KB
• Volume: 28
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2007.900876