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Implant damage and transient enhanced diffusion in Si

โœ Scribed by D.J. Eaglesham; P.A. Stolk; H.-J. Gossmann; T.E. Haynes; J.M. Poate


Book ID
113286817
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
632 KB
Volume
106
Category
Article
ISSN
0168-583X

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