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Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs

โœ Scribed by Kuo, J.J.-Y.; Chen, W.P.-N.; Pin Su,


Book ID
121706338
Publisher
IEEE
Year
2009
Tongue
English
Weight
357 KB
Volume
30
Category
Article
ISSN
0741-3106

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