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Defect-Related Excess Low-Frequency Noise in Ge-on-Si pMOSFETs

✍ Scribed by Simoen, E.; Mitard, J.; De Jaeger, B.; Eneman, G.; Dobbie, A.; Myronov, M.; Leadley, D. R.; Meuris, M.; Hoffmann, T.; Claeys, C.

No coin nor oath required. For personal study only.

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