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Effect of forward and reverse substrate biasing on low-frequency noise in silicon PMOSFETs

✍ Scribed by Deen, M.J.; Marinov, O.

Book ID: 114539015
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 142 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.987110

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