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Identification and characterization of the 1/f low-frequency noise in GaAs MESFETs grown on InP substrates

✍ Scribed by M. Chertouk; A. Chovet; A. Clei


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
196 KB
Volume
19
Category
Article
ISSN
0167-9317

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