๐”– Bobbio Scriptorium
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Impact of Scaling Down on Low Frequency Noise in Silicon MOS Transistors

โœ Scribed by Ghibaudo, G. ;Roux-dit-Buisson, O. ;Brini, J.


Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
350 KB
Volume
132
Category
Article
ISSN
0031-8965

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