𝔖 Bobbio Scriptorium
✦   LIBER   ✦

D.c. and low frequency noise characteristics of γ-irradiated gate-all-around silicon-on-insulator MOS transistors

✍ Scribed by E. Simoen; C. Claeys; S. Coenen; M. Decreton


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
738 KB
Volume
38
Category
Article
ISSN
0038-1101

No coin nor oath required. For personal study only.