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Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors

โœ Scribed by Ghibaudo, G. ;Roux, O. ;Nguyen-Duc, Ch. ;Balestra, F. ;Brini, J.


Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
532 KB
Volume
124
Category
Article
ISSN
0031-8965

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