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Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure

โœ Scribed by Jungil Lee; Byung-Yong Yu; Chul Ho Lee; Gyu-Chul Yi; Seung Hun Son; Gyu-Tae Kim; Gerard Ghibaudo


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
134 KB
Volume
40
Category
Article
ISSN
1386-9477

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