Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure

✍ Scribed by Jungil Lee; Byung-Yong Yu; Chul Ho Lee; Gyu-Chul Yi; Seung Hun Son; Gyu-Tae Kim; Gerard Ghibaudo

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 134 KB
• Volume: 40
• Category: Article
• ISSN: 1386-9477
• DOI: 10.1016/j.physe.2007.10.071