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Impact of Process-Induced Uniaxial Strain on the Temperature Dependence of Carrier Mobility in Nanoscale pMOSFETs

✍ Scribed by W. P. N. Chen; J. J. Y. Kuo; Pin Su


Book ID
126678350
Publisher
IEEE
Year
2010
Tongue
English
Weight
347 KB
Volume
31
Category
Article
ISSN
0741-3106

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