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[IEEE Technology (ICICDT) - Kaohsiung, Taiwan (2011.05.2-2011.05.4)] 2011 IEEE International Conference on IC Design & Technology - Temperature dependence of device mismatch and harmonic distortion in nanoscale uniaxial-strained pMOSFETs

✍ Scribed by Kuo, Jack J.-Y.; Chen, William P.-N.; Su, Pin

No coin nor oath required. For personal study only.

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