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[IEEE Technology (ICICDT) - Kaohsiung, Taiwan (2011.05.2-2011.05.4)] 2011 IEEE International Conference on IC Design & Technology - Soft error modeling, simulation, and testing at advanced technology nodes

✍ Scribed by Bhuva, B. L.; Holman, W. T.; Massengill, L. W.

No coin nor oath required. For personal study only.

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