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Low-Frequency Noise Characterization of Strained Germanium pMOSFETs

✍ Scribed by Simoen, E.; Mitard, J.; De Jaeger, B.; Eneman, G.; Dobbie, A.; Myronov, M.; Whall, T.E.; Leadley, D.R.; Meuris, M.; Hoffmann, T.; Claeys, C.

Book ID: 114620613
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 984 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2160679

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