✦ LIBER ✦

Low-Frequency Noise Assessment of the Oxide Quality of Gate-Last High- $k$ pMOSFETs

✍ Scribed by Simoen, E.; Veloso, A.; Horiguchi, N.; Claeys, C.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Impact of the high vertical electric fie

✍ Mercha, A.; Simoen, E.; Claeys, C. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 504 KB

Low-frequency noise statistics for the b

✍ Butt, N. Z.; Chang, A. M.; Raza, H.; Bashir, R.; Liu, J.; Kwong, D. L. 📂 Article 📅 2006 🏛 American Institute of Physics 🌐 English ⚖ 307 KB

Effects of Gate Oxide and Junction Nonun

✍ Jiménez Tejada, J.A.; Rodríguez, A.L.; Godoy, A.; Rodríguez-Bolívar, S.; Ló 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 424 KB

[IEEE 2013 International Conference on N

✍ Simoen, E.; Veloso, A.; Horiguchi, N.; Paraschiv, V.; Claeys, C. 📂 Article 📅 2013 🏛 IEEE ⚖ 645 KB

A quantum mechanical treatment of low fr

✍ Zhang, Xiaochen; White, Marvin H. 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 485 KB

Characterization of electrically active

✍ H.D. Xiong; D. Heh; M. Gurfinkel; Q. Li; Y. Shapira; C. Richter; G. Bersuker; R. 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 470 KB