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Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors

✍ Scribed by Jiménez Tejada, J.A.; Rodríguez, A.L.; Godoy, A.; Rodríguez-Bolívar, S.; López Villanueva, J.A.; Marinov, O.; Deen, M.J.

No coin nor oath required. For personal study only.

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