๐”– Bobbio Scriptorium
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VIB-4 the effect of channel length and gate oxide thickness on the performance of insulated gate transistors

โœ Scribed by Chow, T.P.; Baliga, B.J.; Chang, M.F.


Book ID
114595424
Publisher
IEEE
Year
1985
Tongue
English
Weight
179 KB
Volume
32
Category
Article
ISSN
0018-9383

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