✦ LIBER ✦
Tunnel DCIV extraction of dopant-impurity concentration, oxide thickness, and length in the channel and extension regions of ultrathin gate-oxide MOS transistors
✍ Scribed by Jie, B.B.; Chih-Tang Sah
- Book ID
- 114617854
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 471 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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