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Effects of Total Dose Irradiation on the Gate-Voltage Dependence of the Noise of nMOS and pMOS Transistors

โœ Scribed by Francis, S.A.; Dasgupta, A.; Fleetwood, D.M.


Book ID
114619872
Publisher
IEEE
Year
2010
Tongue
English
Weight
401 KB
Volume
57
Category
Article
ISSN
0018-9383

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