Lumped model analysis of the low frequency generation noise in gold-doped silicon junction-gate field-effect transistors

✍ Scribed by H.S. Fu; C.T. Sah

• Book ID: 107855862
• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 1022 KB
• Volume: 12
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(69)90034-3