✦ LIBER ✦
Noise of hot carriers in the channel of n silicon junction gate field effect transistors: J. P. Nougier, D. Sodini, M. Rolland, D. Gasquet and G. Lecoy. Solid-St. Electron.21, 133 (1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 128 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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