✦ LIBER ✦

Noise of hot carriers in the channel of n silicon junction gate field effect transistors

✍ Scribed by J.P. Nougier; D. Sodini; M. Rolland; D. Gasquet; G. Lecoy

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Noise of hot carriers in the channel of

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 128 KB

Effects of electron bombardment on the n

✍ I.N. Krishnan; T.M. Chen 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 650 KB

Characteristics of the junction-gate fie

✍ T.L. Chiu; H.N. Ghosh 📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 695 KB

Comparison of gate-edge effects on the h

✍ Y. Pan; K.K. Ng; V. Kwong 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 448 KB

The effect of hot-electron injection on

✍ Ching-Ho Cheng; Charles Surya 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 451 KB

Characteristics of the junction-gate fie

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 115 KB