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Effects of electron bombardment on the noise in junction gate field effect transistors

✍ Scribed by I.N. Krishnan; T.M. Chen

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 650 KB
Volume: 16
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(73)90078-6

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