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G-R noise and microscopic defects in irradiated junction field effect transistors

✍ Scribed by I.N. Krishnan; T.M. Chen

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 896 KB
Volume: 20
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(77)90011-9

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