G-R noise and microscopic defects in irradiated junction field effect transistors : I. N. Krishnan and T. M. Chen. Solid-St. Electron.20, 897 (1977)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 135 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)91265-9