Catastrophic burn out in power VDMOS field-effect transistors : W. J. Slusark, Jr., R. J. Laurie, G. L. Schnable, J. Neilson and E. Finn. IEEE 21st Ann. Proc. Reliab. Phys 173 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 90 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90488-8