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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Impact of oxide trap passivation by fluorine on the low-frequency noise behavior of gate-last pMOSFETs

✍ Scribed by Simoen, E.; Veloso, A.; Horiguchi, N.; Paraschiv, V.; Claeys, C.

Book ID: 121084117
Publisher: IEEE
Year: 2013
Weight: 645 KB
Category: Article
ISBN: 1479906689
DOI: 10.1109/ICNF.2013.6578878

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