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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Gate defects in AlGaN/GaN HEMTs revealed by low frequency noise measurements

✍ Scribed by Tartarin, J. G.; Karboyan, S.; Carisetti, D.; Lambert, B.

Book ID: 121264050
Publisher: IEEE
Year: 2013
Weight: 471 KB
Category: Article
ISBN: 1479906689
DOI: 10.1109/ICNF.2013.6578987

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