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Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

✍ Scribed by Magnone, P.; Crupi, F.; Wils, N.; Jain, R.; Tuinhout, H.; Andricciola, P.; Giusi, G.; Fiegna, C.

No coin nor oath required. For personal study only.

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