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[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Impact of advanced process modules and device architectures on the matching performance of (sub-)45nm CMOS

✍ Scribed by Gustin, C.; Mercha, A.; Loo, J.; Parvais, B.; Subramanian, V.; Dehan, M.; Veloso, A.; Hoffmann, T.; Leys, F. E.; Decoutere, S.

Book ID: 126734533
Publisher: IEEE
Year: 2007
Weight: 233 KB
Category: Article
ISBN-13: 9781424405848
DOI: 10.1109/VTSA.2007.378968

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