✦ LIBER ✦
Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
✍ Scribed by Henson, W.K.; Yang, N.; Kubicek, S.; Vogel, E.M.; Wortman, J.J.; De Meyer, K.; Naem, A.
- Book ID
- 114538208
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 174 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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