Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement

✍ Scribed by Mao-Chyuan Tang; Yean-Kuen Fang; Wen-Shiang Liao; Chen, D.C.; Chune-Sin Yeh; Shan-Chieh Chien

• Book ID: 114619415
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 282 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.921998