Impact of Gate Electrodes on $\hbox{1}/f$ Noise of Gate-All-Around Silicon Nanowire Transistors

✍ Scribed by Chengqing Wei, ; Yu Jiang, ; Yong-Zhong Xiong, ; Xing Zhou, ; Singh, N.; Rustagi, S.C.; Guo Qiang Lo, ; Dim-Lee Kwong,

• Book ID: 121530317
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 356 KB
• Volume: 30
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2009.2027614